The effect of (Ti+Al):V ratio on the structure and oxidation behaviour of TiAlN/VN nano-scale multilayer coatings

Surface and Coatings Technology

Volumn 177-178, Issue , 2004, Pages 252-259

  Lewis, D B ^a   Creasey, S ^a   Zhou, Z ^b   Forsyth, J J ^a   Ehiasarian, A P ^a   Hovsepian, P Eh ^a   Luo, Q ^a   Rainforth, W M ^b   Munz W D ^a  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Nano scale multilayers; Oxidation; Scanning electron microscopy; TiAlN VN coatings; X ray diffraction

Indexed keywords

ETCHING; MAGNETRON SPUTTERING; OXIDATION RESISTANCE; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; THERMOGRAVIMETRIC ANALYSIS; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

TEXTURE EVOLUTION;

PROTECTIVE COATINGS;

COATING;

EID: 1342290067     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2003.09.041     Document Type: Article

References (20)

1. Münz W.-D. Lewis D.B. Hovsepian P.Eh. Schönjahn C. Ehiasarian A. Smith I.J. Surf. Eng. 17 2001 15
2. Lewis D.B. Wadsworth I. Münz W.-D. Kuzel R.Jr. Valvoda V. Surf. Coat. Technol. 116-119 1999 284
3. Wadsworth I. Smith I.J. Donohue L.A. Münz W.-D. Surf. Coat. Technol. 94-5 1997 315
4. Hovsepian P.Eh. Lewis D.B. Münz W.-D. Lyon S.B. Tomlinson M. Surf. Coat. Technol. 120-121 1999 535
5. Hovsepian P.Eh. Lewis D.B. Münz W.-D. Surf. Coat. Technol. 133-134 2000 166
6. Münz W.-D. Schulze D. Hauzer F. Surf. Coat. Technol. 50 1992 169
7. Donohue L.A. Münz W.-D. Lewis D.B., et-al. Surf. Coat. Technol. 93 1997 69
8. Hovsepian P.Eh. Lewis D.B. Münz W.-D. Rouzaud A. Juliet P. Surf. Coat. Technol. 116-119 1999 727
9. Lewis D.B. Wadsworth I.P. Münz W.-D. Kuzel R.Jr. Valvoda V. Surf. Coat. Technol. 116-119 1999 284
10. Hovesepian P.Eh. Lewis D.B. Münz W.-D. Surf. Coat. Technol. 133-134 2000 166
11. Harris G.B. Phil. Mag. 43 1952 113
12. Geist D.E. Perry A.J. Treglio J.R. Valvoda V. Rafaja D. Adv. X-ray Anal. 38 1995 471
13. D.B. Lewis, P. Eh. Hovsepian, W.-D. Münz, Seventh International Symposium on Trends and Applications of Thin Films, TAFT 2000 Nancy France, 28-30 March 2000, Société Francaise du Vide
14. Farges G. Beuprez E. Staine-Catherine M.C. Surf. Coat. Technol. 54-55 1992 115
15. Münz W.-D. J. Vac. Sci. Tecnol. A 4 1986 2717
16. Yamaguchi O. Uegaki T. Miyata Y. Shimizu K. J. Am. Ceram. Soc. 70 8 1987 198
17. Abdalla F.H.A. El-Shobaky G.A. Hassan N.A. Bull. Soc. Chim. Belg. 103 11 1994 665
18. 2000 JCPDS-International Centre for Diffraction Data
19. McIntyre D. Greene J.E. Håkansson G. Sundgren J.-E. Münz W.-D. J. Appl. Phys. 67 1990 1542
20. Donohue L.A. Smith I.J. Münz W.-.D. Petrov I. Greene J.E. Surf. Coat. Technol. 94/95 1997 226