Grain-Size Effect on Shape-Memory Behavior of Ti35.0Ni 49.7Zr15.4 Thin Films

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 35 A, Issue 1, 2004, Pages 111-119

  Sawaguchi, Takahiro ^a   Sato, Morio ^a   Ishida, Akira ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ANNEALING; ELECTROLYTIC POLISHING; FRACTURE TOUGHNESS; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; MICROELECTROMECHANICAL DEVICES; PHASE DIAGRAMS; SHAPE MEMORY EFFECT; TERNARY SYSTEMS; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

TERNARY-PHASE DIAGRAMS;

THIN FILMS;

EID: 1342265445     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-004-0114-8     Document Type: Article

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