Open circuit voltage losses in multicrystalline silicon: an investigation by Mini Solar Cells (MSC)

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 641-644

  Baldner, R ^a   Lautenschlager, H ^a   Schetter, C ^a   Schindler, R ^a   Warta, W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; CRYSTALLINE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC LOSSES; ELECTRIC WIRE; PHOTOLITHOGRAPHY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DIODES; VOLTAGE MEASUREMENT;

BRIGHT CURRENT VOLTAGE MEASUREMENT; DARK CURRENT VOLTAGE MEASUREMENT; MINI SOLAR CELLS; MODULATED FREE CARRIER ABSORPTION METHOD; MULTICRYSTALLINE SILICON; WIRE BONDING;

SOLAR CELL ARRAYS;

EID: 0030385109     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/pvsc.1996.564210     Document Type: Conference Paper

References (2)