High-temperature RF probe station for device characterization through 500 °C and 50 GHz

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 1, 2005, Pages 369-376

  Schwartz, Zachary D ^a   Downey, Alan N ^a   Alterovitz, Samuel A ^a   Ponchak, George E ^a  

^a NASA GLENN RESEARCH CENTER   (United States)

Author keywords

Coplanar waveguide; High temperature; Microwave measurements; Radio frequency (RF) probing; SiC

Indexed keywords

GRAPHICAL USER INTERFACES; HIGH TEMPERATURE OPERATIONS; PASSIVE NETWORKS; PERMITTIVITY; SCATTERING PARAMETERS; SILICON CARBIDE; TRANSMISSION LINE THEORY; WAVEGUIDES;

HIGH TEMPERATURE PROBE STATION; RADIO FREQUENCY (RF) PROBING;

MICROWAVE MEASUREMENT;

EID: 13244273590     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.838137     Document Type: Article

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