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Volumn 39, Issue 6, 2003, Pages 535-536

Temperature dependence of attenuation of coplanar waveguide on semi-insulating 4H-SiC through 540°C

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC LINES; ELECTROMAGNETIC WAVE ATTENUATION; MICROWAVES; SILICON CARBIDE; THERMAL EFFECTS; WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 0037456947     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20030356     Document Type: Article
Times cited : (7)

References (3)
  • 2
    • 0012707907 scopus 로고    scopus 로고
    • Cree wafer number BV0302-11, part number W4TRD8R-0D00
    • Cree wafer number BV0302-11, part number W4TRD8R-0D00
  • 3
    • 0026188064 scopus 로고
    • A multiline method of network analyzer calibration
    • MARKS, R.B.: 'A multiline method of network analyzer calibration', IEEE Trans. Microw. Theory Tech., 1991, 39, pp. 1205-1215
    • (1991) IEEE Trans. Microw. Theory Tech. , vol.39 , pp. 1205-1215
    • Marks, R.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.