High-reliability programmable CMOS WTA/LTA circuit of O(N) complexity using a single comparator

IEE Proceedings: Circuits, Devices and Systems

Volumn 151, Issue 6, 2004, Pages 579-586

  Hung, Y C ^a   Liu, B D ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPARATOR CIRCUITS; COMPUTER SIMULATION; LOGIC GATES; MONTE CARLO METHODS; SCHEMATIC DIAGRAMS; THRESHOLD VOLTAGE; TRANSISTORS; VLSI CIRCUITS;

BLOCK CIRCUITS; CIRCUIT DESIGN; PROGRAMMABLE CMOS CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 13244251084     PISSN: 13502409     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-cds:20040654     Document Type: Article

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