Composite nanowire-based probes for magnetic resonance force microscopy

Nano Letters

Volumn 5, Issue 1, 2005, Pages 187-190

  Barbic, Mladen ^a   Scherer, Axel ^b  

^a CALIFORNIA STATE UNIVERSITY   (United States)

^b California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC FIELD IMAGING GRADIENTS; MECHANICAL DETECTION; NANOWIRES; ULTRAHIGH SENSITIVITY;

DEPOSITION; ELECTROCHEMISTRY; IMAGING TECHNIQUES; MAGNETIC FIELD EFFECTS; MAGNETIC FIELDS; MAGNETIC RESONANCE MEASUREMENT; SENSORS;

NANOSTRUCTURED MATERIALS;

EID: 12844285646     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl048373b     Document Type: Article

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