Measurement of ion-exchanged waveguide burial depth with a camera

Optical Engineering

Volumn 43, Issue 12, 2004, Pages 3149-3154

  Frantz, Jesse A ^a   Carriere, James T A ^b   Kostuk, Raymond K ^b  

^a SFA INC   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

Buried waveguides; Ion exchanged waveguides; Mode profiles

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; INTEGRATED OPTICS; LIGHT REFLECTION; MIRRORS; OPTICAL GLASS; SINGLE MODE FIBERS;

BURIED WAVEGUIDES; ION EXCHANGED WAVEGUIDES; MODE PROFILES;

OPTICAL WAVEGUIDES;

EID: 12844249481     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1814364     Document Type: Article

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