Concentration profiles of ion exchanged optical waveguides in glass: Analysed in hollow cathode plasma

Surface and Coatings Technology

Volumn 166, Issue 2-3, 2003, Pages 201-205

  Djulgerova, R ^a   Pantchev, B ^a   Mihailov, V ^a   Gencheva, V ^b   Flaga, J ^c  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^c JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

Depth profiling; Glow discharge sputtering; Hollow cathode discharge; Optical waveguides

Indexed keywords

GLASS; ION EXCHANGE; IONS; POTASSIUM; REFRACTIVE INDEX; SILVER; SODIUM; SPECTRUM ANALYSIS;

HOLLOW CATHODE PLASMA;

OPTICAL WAVEGUIDES;

PLASMA TREATMENT;

EID: 0037464305     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(02)00788-0     Document Type: Article

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