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Volumn 808, Issue , 2004, Pages 617-622
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Devices fabrication with narrow-bandgap a-SiGe:H alloys deposited by HWCVD
a b a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
PHOTONS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
QUANTUM EFFICIENCY;
SECONDARY ION MASS SPECTROMETRY;
SILICON COMPOUNDS;
SOLAR CELLS;
BANDGAP GRADING;
BANDGAP MATERIALS;
BANDGAP PROFILING;
HOT-WIRE CHEMICAL VAPOR DEPOSITION (HWCVD);
AMORPHOUS ALLOYS;
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EID: 12744267765
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-808-a9.51 Document Type: Conference Paper |
Times cited : (5)
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References (12)
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