Microstructure evolution with thickness and hydrogen dilution profile in microcrystalline silicon solar cells

Materials Research Society Symposium Proceedings

Volumn 808, Issue , 2004, Pages 575-580

  Yan, Baojie ^a   Yue, Guozhen ^a   Yang, Jeffrey ^a   Guha, Subhendu ^a   Williamson, D L ^b   Han, Daxing ^c   Jiang, Chun Sheng ^d  

^a UNITED SOLAR OVONIC LLC   (United States)

^b Department of Metallurgical and Materials Engineering   (United States)

^c UNIVERSITY OF NORTH CAROLINA   (United States)

^d NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; HYDROGEN; MICROSTRUCTURE; RAMAN SCATTERING; SILICON; STAINLESS STEEL; X RAY DIFFRACTION;

ACTIVE-AREA EFFICIENCY; CELL PERFORMANCE; DILUTION PROFILE; INTRINSIC LAYER;

SOLAR CELLS;

EID: 12744250282     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-808-a8.5     Document Type: Conference Paper

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