Domain wall creep in mixed c-a axis Pb(Zr0.2Ti 0.8)O3 thin films

Annalen der Physik (Leipzig)

Volumn 13, Issue 1-2, 2004, Pages 95-96

  Paruch, P ^a   Giamarchi, T ^a   Triscone, J M ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

Atomic force microscopy; Creep; Ferroelectric domains

Indexed keywords

ACOUSTIC WAVES; ATOMIC FORCE MICROSCOPY; CREEP; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MAGNETRON SPUTTERING;

DOMAIN WALL CREEP; RANDOM BOND DISORDER;

THIN FILMS;

EID: 1242351948     PISSN: 00033804     EISSN: None     Source Type: Journal    
DOI: 10.1002/andp.200310062     Document Type: Conference Paper

References (10)

1. J.F. Scott, Phys. World 46, February (1995).
2. T. Hidaka et al., Integr. Ferroelectr. 17, 319 (1997).
3. D. Marré et al., Appl. Phys. A, to appear.
4. T. Tybell et al., Phys. Rev. Lett. 89, 097601 (2002).
5. V. Gopalan et al., Appl. Phys. Lett. 68, 888 (1996).
6. J. Scott et al., Appl. Phys. Lett. 76, 3801 (2000).
7. C. S. Ganpule et al., Phys. Rev. B 65, 14101 (2002).
8. T. Tybell et al., Appl. Phys. Lett. 72, 1454 (1998).
9. J.-M. Triscone et al., J. Appl. Phys. 79, 4298 (1996).
10. P. Paruch et al., Appl. Phys. Lett. 79, 530 (2001).