Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 12, 2003, Pages 7635-7639

  Kim, JunHo ^a   Kim, Jeongyong ^b   Song, K B ^a   Lee, S Q ^a   Kim, E K ^a   Park, K H ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^b SolarLight Ltd   (South Korea)

Author keywords

AFM; FDTD; Nanoprotrusion; SNOM; Surface plasmon; Tip modification

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FINITE DIFFERENCE METHOD; LIGHT POLARIZATION; METALLIC FILMS; NANOSTRUCTURED MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DEVICES; OXIDATION; SILVER; TIME DOMAIN ANALYSIS;

FDTD; FINITE DOMAIN TIME DIFFERENCE (FDTD) SIMULATIONS; NANOPROTRUSION; TIP MODIFICATION;

LIGHT TRANSMISSION;

EID: 1242332790     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.7635     Document Type: Article

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