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Volumn 2, Issue , 2003, Pages 659-664
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Thermal issues in next generation integrated circuits
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Author keywords
Chip centric cooling; Electronic cooling; ITRS roadmap
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Indexed keywords
BOUNDARY CONDITIONS;
COOLING;
CORROSION;
FINITE ELEMENT METHOD;
HEAT RESISTANCE;
HEAT TRANSFER;
HEAT TRANSFER COEFFICIENTS;
MICROPROCESSOR CHIPS;
THERMAL CONDUCTIVITY;
THERMAL EFFECTS;
TEMPERATURE CONTROL;
CHIP-CENTRIC COOLING;
ELECTRONIC COOLING;
ITRS ROADMAPS;
COOLING OF ELECTRONICS;
COOLING SOLUTIONS;
CURRENT GENERATION;
ELECTRONIC DEVICE;
FUNDAMENTAL LIMITS;
HEAT REMOVAL;
HIGH-PERFORMANCE MICROPROCESSORS;
INTERFACE THERMAL RESISTANCE;
ITRS ROADMAP;
OVERALL THERMAL RESISTANCE;
POWER DISSIPATION;
TEMPERATURE RISE;
THERMAL MANAGEMENT;
VARIOUS CONFIGURATION;
INTEGRATED CIRCUITS;
CHIP SCALE PACKAGES;
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EID: 1242331850
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1115/ipack2003-35309 Document Type: Conference Paper |
Times cited : (7)
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References (8)
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