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Volumn 2, Issue , 2003, Pages 659-664

Thermal issues in next generation integrated circuits

Author keywords

Chip centric cooling; Electronic cooling; ITRS roadmap

Indexed keywords

BOUNDARY CONDITIONS; COOLING; CORROSION; FINITE ELEMENT METHOD; HEAT RESISTANCE; HEAT TRANSFER; HEAT TRANSFER COEFFICIENTS; MICROPROCESSOR CHIPS; THERMAL CONDUCTIVITY; THERMAL EFFECTS; TEMPERATURE CONTROL;

EID: 1242331850     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/ipack2003-35309     Document Type: Conference Paper
Times cited : (7)

References (8)
  • 3
    • 22844456808 scopus 로고    scopus 로고
    • Analysis of Joule Heating in Multilevel Interconnects
    • Y. L. Shen, "Analysis of Joule Heating in Multilevel Interconnects," Journal of Vacuum. Science and Technology B, vol. 17, pp. 2115-2121, 1999.
    • (1999) Journal of Vacuum. Science and Technology B , vol.17 , pp. 2115-2121
    • Shen, Y.L.1
  • 4
    • 0003973615 scopus 로고
    • Wiley-Interscience Publication, New York
    • M. N. Ozisik, Heat Conduction, Wiley-Interscience Publication, New York, 1980.
    • (1980) Heat Conduction
    • Ozisik, M.N.1
  • 8
    • 1242350953 scopus 로고    scopus 로고
    • Experimental Determination of Thermal Conductivity of Printed Wiring Boards
    • August
    • K. Azar and J. E. Graebner, "Experimental Determination of Thermal Conductivity of Printed Wiring Boards", Journal of Heat Transfer, vol. 119, pp. 401-405, August 1997.
    • (1997) Journal of Heat Transfer , vol.119 , pp. 401-405
    • Azar, K.1    Graebner, J.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.