Reliability prediction: the turn-over point

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1997, Pages 254-262

  Talmor, Michael ^a   Arueti, Shimshon ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT TESTING; PROBABILITY;

DETERMINISTIC RELIABILITY; ENVIRONMENTAL STRESS SCREENING; PHYSICS OF FAILURE; RELIABILITY PREDICTION;

RELIABILITY;

EID: 0030784096     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)