Reliability Prediction and Assessment of Electronic Systems and Equipment

IEEE Transactions on Components and Packaging Technologies

Volumn 22, Issue 1, 1999, Pages 127-128

  Cartwright, Jerry ^a   Donahoe, Daniel N ^b   Jackson, Margaret ^c  

^a Honeywell Microswitch   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85008041921     PISSN: 15213331     EISSN: 15579972     Source Type: Journal    
DOI: 10.1109/TCAPT.1999.759362     Document Type: Article

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