Absolute measurement of the second-order nonlinearity profile in poled silica

Optics Letters

Volumn 23, Issue 8, 1998, Pages 588-590

  Pureur, D ^a,b   Liu, A C ^a   Digonnet, M J F ^a   Kino, G S ^a  

^a STANFORD UNIVERSITY   (United States)

^b UNIV LILLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000164702     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.23.000588     Document Type: Article

References (5)

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4. R. A. Myers, N. Mukherjee, and S. R. J. Brueck, Opt. Lett. 16, 1732 (1991).
5. P. G. Kazansky, A. Kamal, and P. St. J. Russell, Opt. Lett. 18, 693 (1993).