Total dose and single event effects testing of UTMC Commercial RadHard TM gate arrays

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1998, Pages 80-85

  Kerwin, D B ^a   Benedetto, J M ^a  

^a UTMC Microelectronic Systems   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SINGLE EVENT EFFECTS; STANDARD EVALUATION CIRCUITS;

GATES (TRANSISTOR); MICROELECTRONIC PROCESSING; PARALLEL PROCESSING SYSTEMS; TESTING;

RADIATION DAMAGE;

EID: 0032291798     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)