Low-noise silicon carbide X-ray sensor with wide operating temperature range

Electronics Letters

Volumn 40, Issue 3, 2004, Pages 173-174

  Bertuccio, G ^a   Casiraghi, R ^a   Cetronio, A ^b   Lanzieri, C ^b   Nava, F ^c  

^a POLITECNICO DI MILANO   (Italy)

^b ALENIA SPAZIO   (Italy)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRONS; GAMMA RAYS; PHOTOELECTRICITY; SILICON CARBIDE; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS; X RAY SPECTROSCOPY; X RAYS;

OPERATING TEMPERATURE; X-RAY SENSORS;

OPTICAL SENSORS;

EID: 1242298644     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20040126     Document Type: Article

References (10)

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