Anisotropic in-plane strains and dielectric properties in (Pb,Sr)TiO 3 thin films on NdGaO 3 substrates

Applied Physics Letters

Volumn 84, Issue 4, 2004, Pages 577-579

  Lin, Y ^a   Chen, X ^b,d   Liu, S W ^b   Chen, C L ^b   Lee, Jang Sik ^a   Li, Y ^a   Jia, Q X ^a   Bhalla, A ^c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b University of Houston   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

^d TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ORTHORHOMBIC STRUCTURES; RECIPROCAL SPACE MAPS (RSM);

ANISOTROPY; CAPACITANCE; CRYSTAL LATTICES; CRYSTALLIZATION; DIFFRACTOMETERS; ELECTRIC FIELD EFFECTS; ELECTRIC IMPEDANCE; EPITAXIAL GROWTH; LEAD COMPOUNDS; NEODYMIUM COMPOUNDS; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; SINGLE CRYSTALS; STRAIN; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 1242285018     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1643546     Document Type: Article

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