Radiation evaluation of 3.3 Volt 16 M-bit DRAMs for solid state mass memory space applications

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1998, Pages 74-79

  Harboe Sorensen, R ^a   Bruggemann, M ^a   Muller, R ^a   Rombeck, F J ^a  

^a EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; RADIATION DAMAGE; TESTING;

SINGLE EVENT EFFECTS;

SPACECRAFT EQUIPMENT;

EID: 0032291799     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)