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Volumn 235, Issue 1, 2003, Pages 107-110

Shallow donor activity of S-H, Se-H, and Te-H complexes in silicon

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN; INFRARED DETECTORS; MOSSBAUER SPECTROSCOPY; PARAMAGNETIC RESONANCE; PASSIVATION; SEMICONDUCTING SELENIUM; SEMICONDUCTING TELLURIUM;

EID: 1242265015     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200301543     Document Type: Conference Paper
Times cited : (1)

References (13)
  • 8
    • 77956737999 scopus 로고    scopus 로고
    • Semiconductors and Semimetals, edited by M. Stavola (Academic Press, London/New York)
    • R. Jones and P. R. Briddon, Identification of Defects in Semiconductors, Vol. 51 A, Semiconductors and Semimetals, edited by M. Stavola (Academic Press, London/New York, 1998), p. 287.
    • (1998) Identification of Defects in Semiconductors , vol.51 A , pp. 287
    • Jones, R.1    Briddon, P.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.