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Volumn 51, Issue PART A, 1998, Pages 287-349

Chapter 6 The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO; CLUSTER METHOD; DEFECTS IN SEMICONDUCTORS;

EID: 77956737999     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)63058-6     Document Type: Article
Times cited : (114)

References (108)
  • 13
    • 77956721267 scopus 로고    scopus 로고
    • Unpublished
    • Briddon, P. R. (1996). Unpublished
    • (1996)
    • Briddon, P.R.1
  • 34
    • 77956774340 scopus 로고    scopus 로고
    • Private communication
    • Fushimi, H. and Wada, T. (1996). Private communication
    • (1996)
    • Fushimi, H.1    Wada, T.2
  • 91


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.