Anomalous dynamical charge change behavior of nanocrystalline 3C-SiC upon compression

Journal of the American Ceramic Society

Volumn 87, Issue 12, 2004, Pages 2291-2293

  Liu, Haozhe ^a,b   Jin, Changqing ^c   Chen, Jiuhua ^b   Hu, Jingzhu ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

^c INSTITUTE OF PHYSICS   (China)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN SIZE AND SHAPE; PHONONS; PRESSURE EFFECTS; RAMAN SCATTERING; SILICON COMPOUNDS; STIFFNESS; STRAIN; X RAY DIFFRACTION;

DIAMOND ANVIL CELLS (DAC); LONGITUDINAL OPTICAL-TRANSVERSE OPTICAL (LO-TO); PRESSURE CALIBRATION; ROOM TEMPERATURE;

NANOSTRUCTURED MATERIALS;

EID: 12344303368     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2004.tb07508.x     Document Type: Article

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