Application of X-ray powder diffraction to nano-materials - Determination of the atomic structure of nanocrystals with relaxed and strained surfaces

Phase Transitions

Volumn 76, Issue 1-2, 2003, Pages 171-185

  Palosz, B ^a   Grzanka, E ^a,b   Gierlotka, S ^a   Stel'makh, S ^a   Pielaszek, R ^a,b   Lojkowski, W ^a   Bismayer, U ^c   Neuefeind, J ^d   Weber, H P ^e   Palosz, W ^f  

^a INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

^b UNIVERSITY OF WARSAW   (Poland)

^c UNIVERSITY OF HAMBURG   (Germany)

^d DESY   (Germany)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^f NASA MARSHALL SPACE FLIGHT CENTER   (United States)

Author keywords

Diffraction; Nano crystals; SiC; Surface structure

Indexed keywords

CRYSTAL LATTICES; NANOSTRUCTURED MATERIALS; PARAMETER ESTIMATION; SILICON CARBIDE; SURFACE STRUCTURE; X RAY POWDER DIFFRACTION;

BRAGG APPROXIMATION; INFINITE CRYSTAL LATTICE; NANO-CRYSTALS; NANO-SIZE CRYSTALLITES;

CRYSTAL ATOMIC STRUCTURE;

EID: 33746386885     PISSN: 01411594     EISSN: 10290338     Source Type: Journal    
DOI: 10.1080/0141159031000076129     Document Type: Article

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