Industrial SR TXRF facility at ESRF

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 150, Issue 1-4, 1999, Pages 538-542

  Comin, F ^a   Navizet, M ^a   Mangiagalli, P ^a   Apostolo, G ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; FLUORESCENCE; MERCURY (METAL); SILICON WAFERS; SODIUM; SYNCHROTRON RADIATION;

DETECTION LIMIT; TRACE IMPURITIES;

X RAYS;

EID: 0033515145     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)01042-8     Document Type: Article

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5. R. Goergl et al., X-Ray Spectr. 26 (1997) 189.
6. Wobrauschek et al., Spectrochimica Acta Part B 52 (1997) 901.
7. C. Streli et al., Nucl. Instr. and Meth. Phys. Res. A 345 (1994) 399.
8. Ortega L., Comin F., Formoso V., Stierle A. Journal of Synch. Radiation. 5:1998;1064.
9. L. Vincze, K. Janssens, F. Adams, F. Comin, L. Ortega. Book of Abstracts, European Conference on Energy Dispersive X-ray Spectrometry 1998 (EDXRS-98), 1998, p. 108.
10. J. Chavanne, P. Elleaume, P. Van Vaerenbergh. Proceedings of the European Accelerator Conference 1998, June 1998, Stockholm. www.cern.ch/accelconf/e98/PAPERS/MOP07F.PDF.
11. F. Comin, M. Navizet, P. Mangiagalli, A. Freund, Proc. Intern. Symp. On Optical Science, Eng., and Instr. Conference 3448: Crystal and Multilayer Optics. San Diego, July 1998.