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Volumn 10, Issue 6, 2004, Pages 365-370

Robust minimization of lighting variation for real-time defect detection

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; IMAGE QUALITY; IMAGE SENSORS; INTEGRATED CIRCUITS; INTERPOLATION; LINEAR PROGRAMMING; MATHEMATICAL MODELS; REAL TIME SYSTEMS; SEMICONDUCTOR DEVICE MANUFACTURE; SIGNAL TO NOISE RATIO;

EID: 11844303450     PISSN: 10772014     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.rti.2004.08.001     Document Type: Article
Times cited : (4)

References (15)
  • 2
    • 0032649614 scopus 로고    scopus 로고
    • A novel illumination compensation algorithm for industrial inspection
    • Machine vision applications in industrial inspection
    • Lai S-H, Fang M. A novel illumination compensation algorithm for industrial inspection. In: Machine vision applications in industrial inspection. Proceedings of the SPIE, vol. 3652, 1999. p. 50-8.
    • (1999) Proceedings of the SPIE , vol.3652 , pp. 50-58
    • Lai, S.-H.1    Fang, M.2
  • 6
    • 10844271623 scopus 로고    scopus 로고
    • Simultaneous homographic and comparametric alignment of multiple exposure-adjusted pictures of the same scene
    • F.M. Candocia Simultaneous homographic and comparametric alignment of multiple exposure-adjusted pictures of the same scene IEEE Transactions on Image Processing 12 12 2003 1485 1494
    • (2003) IEEE Transactions on Image Processing , vol.12 , Issue.12 , pp. 1485-1494
    • Candocia, F.M.1
  • 9
    • 0344704004 scopus 로고    scopus 로고
    • Graylevel alignment between two images using linear programming
    • Lam EY. Graylevel alignment between two images using linear programming. In: 2003 International conference on image processing, vol. 2, 2003. p. 327-30.
    • (2003) 2003 International Conference on Image Processing , vol.2 , pp. 327-330
    • Lam, E.Y.1
  • 14
    • 0036464402 scopus 로고    scopus 로고
    • Micro inspection for wafer bumping
    • S. Hibert Micro inspection for wafer bumping Advanced Packaging 11 2 2002 19 22
    • (2002) Advanced Packaging , vol.11 , Issue.2 , pp. 19-22
    • Hibert, S.1
  • 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.