메뉴 건너뛰기




Volumn 2, Issue , 2003, Pages 327-330

Graylevel alignment between two images using linear programming

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CONSTRAINT THEORY; IMAGE QUALITY; LEAST SQUARES APPROXIMATIONS; LINEAR PROGRAMMING; SIGNAL TO NOISE RATIO;

EID: 0344704004     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (4)
  • 3
    • 0036464402 scopus 로고    scopus 로고
    • Micro inspection for wafer bumping
    • February
    • Steve Hibert, "Micro inspection for wafer bumping," Advanced Packaging, vol. 11, no. 2, pp. 19-22, February 2002.
    • (2002) Advanced Packaging , vol.11 , Issue.2 , pp. 19-22
    • Hibert, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.