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Volumn 242, Issue 1-2, 2005, Pages 168-176
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Characterization of copper indium ditelluride/electrolyte interface utilizing electrochemical impedance spectroscopy
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Author keywords
Copper indium telluride; Flat band; Impedance; Semiconductor; Surface chemistry
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Indexed keywords
CAPACITANCE;
CARRIER CONCENTRATION;
ELECTRIC IMPEDANCE;
ELECTROLYTES;
ELECTRONIC STRUCTURE;
ETCHING;
PH EFFECTS;
PHOTOELECTROCHEMICAL CELLS;
POLISHING;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR MATERIALS;
SOLAR CELLS;
SURFACE CHEMISTRY;
THIN FILM DEVICES;
X RAY PHOTOELECTRON SPECTROSCOPY;
COPPER INDIUM TELLURIDE (CIT);
FLAT-BAND;
MOTT-SCHOTTKY ANALYSIS;
PHOTOELECTROCHEMICAL SOLAR CELLS (PESC);
COPPER COMPOUNDS;
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EID: 11844260010
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.08.027 Document Type: Article |
Times cited : (19)
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References (20)
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