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Volumn 12, Issue 4, 2004, Pages 405-409

Linear and nonlinear optical properties of Zn1-xMgxSe layers grown by MBE and PLD methods

Author keywords

Photoreflection; Reflection; Refractive index; Transmission; Two photon absorption

Indexed keywords

ABSORPTION; ENERGY GAP; LIGHT EMITTING DIODES; MOLECULAR BEAM EPITAXY; NONLINEAR SYSTEMS; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; REFLECTION; REFRACTIVE INDEX; TERNARY SYSTEMS; WAVE TRANSMISSION;

EID: 11844252609     PISSN: 12303402     EISSN: 18963757     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (16)

References (10)
  • 2
    • 0000842192 scopus 로고    scopus 로고
    • Refractive index measurements of MgZnCdSe II-VI compound semiconductors grown on InP substrates and fabrications of 500-600 nm range MgZnCdSe distributed Bragg reflectors
    • T. Morita, H. Shinbo, T. Nagano, I. Nomura, A. Kikuchi, and K. Kishino, "Refractive index measurements of MgZnCdSe II-VI compound semiconductors grown on InP substrates and fabrications of 500-600 nm range MgZnCdSe distributed Bragg reflectors", J. Appl. Phys. 81, 7575-7579 (1997).
    • (1997) J. Appl. Phys. , vol.81 , pp. 7575-7579
    • Morita, T.1    Shinbo, H.2    Nagano, T.3    Nomura, I.4    Kikuchi, A.5    Kishino, K.6
  • 3
    • 0030108311 scopus 로고    scopus 로고
    • The study of third order nonlinearities in ZnCdSe-ZnSe/GaAs MQWs using Z-scan
    • J. Ma, S.M. Wang, D.Z. Shen, X.W. Fan, and J.Q. Yu, "The study of third order nonlinearities in ZnCdSe-ZnSe/GaAs MQWs using Z-scan", Solid State Commun. 97, 961-963 (1996).
    • (1996) Solid State Commun. , vol.97 , pp. 961-963
    • Ma, J.1    Wang, S.M.2    Shen, D.Z.3    Fan, X.W.4    Yu, J.Q.5
  • 4
    • 0024715067 scopus 로고
    • Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum
    • D.A. Minkov, "Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum", J. Phys. D: Appl. Phys. 22, 1157-1161 (1989).
    • (1989) J. Phys. D: Appl. Phys. , vol.22 , pp. 1157-1161
    • Minkov, D.A.1
  • 5
    • 0029378836 scopus 로고
    • xTe epitaxial layers: A variable-angle spectroscopic ellipsometry study
    • xTe epitaxial layers: A variable-angle spectroscopic ellipsometry study", J. Appl. Phys. 78, 3387-3391 (1995).
    • (1995) J. Appl. Phys. , vol.78 , pp. 3387-3391
    • Luttmann, M.1    Bertin, F.2    Chabli, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.