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Volumn 81, Issue 11, 1997, Pages 7575-7579

Refractive index measurements of MgZnCdSe II-VI compound semiconductors grown on InP substrates and fabrications of 500-600 nm range MgZnCdSe distributed Bragg reflectors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000842192     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365301     Document Type: Article
Times cited : (22)

References (13)
  • 9
    • 85033316262 scopus 로고    scopus 로고
    • edited by R. K. Willardson and A. C. Beer (Academic, New York,)
    • M. Hass, Semiconductor & Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York,), Vol. 3, p. 12.
    • Semiconductor & Semimetals , vol.3 , pp. 12
    • Hass, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.