Shear strains in dry etched GaAs/AlAs wires studied by high resolution x-ray reciprocal space mapping

Journal of Applied Physics

Volumn 83, Issue 1, 1998, Pages 126-131

  Darhuber, A A ^a   Bauer, G ^a   Wang, P D ^b,c   Sotomayor Torres, C M ^b,d  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c University of Notre Dame   (United States)

^d UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11744375232     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366709     Document Type: Article

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