Atomic-level investigation of interface structure in Ni-Al multilayer system: Molecular dynamics simulation

Journal of Magnetism and Magnetic Materials

Volumn 286, Issue SPEC. ISS., 2005, Pages 394-398

  Lee, Soon Gun ^a   Kim, Sang Pil ^a   Lee, Kwang Ryeol ^b   Chung, Yong Chae ^a  

^a University of Seoul   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

Embedded atom method (EAM); Interface structure; Molecular dynamics simulation; Ni Al metallic multilayer

Indexed keywords

EMBEDDED ATOM METHOD (EAM); INCIDENT ENERGY; INTERFACE STRUCTURES; NI-AL METALLIC MULTILAYERS;

COMPOSITION; COMPUTER SIMULATION; INTERFACES (MATERIALS); MOLECULAR DYNAMICS; MULTILAYERS; POLARIZATION; TUNNEL JUNCTIONS;

NICKEL ALLOYS;

EID: 11444252406     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2004.09.098     Document Type: Conference Paper

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