Behaviour of helium in UO2 single crystals: A transmission electron microscopy investigation

Philosophical Magazine Letters

Volumn 84, Issue 2, 2004, Pages 109-115

  Sattonnay, G ^a   Garrido, F ^a   Thome L ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CERAMIC MATERIALS; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; HELIUM; ION IMPLANTATION; POSITIVE IONS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

HELIUM DETRAPPING; RADIATION-INDUCED DEFECT;

URANIUM COMPOUNDS;

EID: 1142293165     PISSN: 09500839     EISSN: None     Source Type: Journal    
DOI: 10.1080/09500830310001649137     Document Type: Article

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