TEM and SEM studies of radiation blistering in helium-implanted copper

Journal of Nuclear Materials

Volumn 273, Issue 2, 1999, Pages 117-129

  Johnson, P B ^a   Thomson, R W ^a   Reader, Karen ^a  

^a VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; POROUS MATERIALS; RADIATION EFFECTS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

NANOPOROSITY; RADIATION BLISTERING;

COPPER;

EID: 0032629244     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(99)00046-X     Document Type: Article

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