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11344258995
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20Zr: C, 40.72; H, 7.18. Found: C, 40.86; H, 7.27.
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11344295753
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note
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2 = 0.057. The 2580 independent reflections (2θ < 50°; I > 2σ(I)) were collected using Mo Kα radiation on an Enraf-Nonius CAD4TSB diffractometer using ω-2θ scans. The Flack X parameter of 0.01 indicates the right choice of absolute configuration.
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24
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0000111755
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27
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11344282149
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note
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-1) v(B-H) 2562 (vs), 2596 (vs); high-resolution MS (EI) m/z calcd 410.0920, found 410.0953.
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28
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11344278083
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Dow Chemical Co. European Patent 0416815A2, 1990
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Dow Chemical Co. European Patent 0416815A2, 1990.
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