Microstructural characterization of sol-gel derived Pb 1-xLa xTiO 3 ferroelectrics

Journal of Alloys and Compounds

Volumn 388, Issue 2, 2005, Pages 308-313

  Chen, Jun ^a   Xing, Xianran ^a   Yu, Ranbo ^a   Deng, Jinxia ^a   Liu, Guirong ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Pb 1 xLa XTiO 3; SEM; Valence fluctuations; X ray powder diffraction; XPS

Indexed keywords

EXOTHERMIC PEAKS; PB1-XLAXTIO3; VALENCE FLUCTUATIONS; X-RAY PHOTOELECTRIC SPECTROSCOPY;

FERROELECTRICITY; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; MICROSTRUCTURE; PARAMAGNETIC RESONANCE; POSITIVE IONS; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY POWDER DIFFRACTION;

SOL-GELS;

EID: 11344254422     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.07.038     Document Type: Article

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