Micro-arcsecond metrology (MAM) testbed overview

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4852, Issue 1, 2002, Pages 45-56

  Hines, B E ^a   Bell, C E ^a   Goullioud, R ^a   Spero, R ^a   Neat, G W ^a   Shen, T J ^a   Bloemhof, E E ^a   Shao, M ^a   Catanzarite, J ^a   Regehr, M ^a   Machuzak, R ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

MAM; Microarcsecond astrometry; Optical interferometry; Picometer metrology; SIM

Indexed keywords

INTERFEROMETERS; LASER APPLICATIONS; MICROOPTICS; PRECISION ENGINEERING; SPACE APPLICATIONS; SPACE OPTICS; TECHNOLOGY TRANSFER;

LASER METROLOGY SYSTEM; MICROARCSECOND METROLOGY; OPTICAL INTERFEROMETRY; PICOMETER METROLOGY; SPACE INTERFEROMETRY MISSION;

INTERFEROMETRY;

EID: 0038288001     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.460919     Document Type: Conference Paper

References (9)

1. S. Shaklan et al, "Micro-arcsecond metrology testbed", Proc. SPIE, 3350, p. 1009.
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3. G. Neat, "MAM testbed and its relationship to SIM," SPIE conference Interferometry in Space, vol. 4852, 2002.
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5. F. Zhao, R. Diaz, G. M. Kuan, N. Sigrist, Y. Beregovski, L. L. Ames, K. Dutta, "Internal metrology beam launcher development for the space interferometry mission," SPIE conference Interferometry in Space, vol. 4852, 2002.
6. D. B. Schaechter, P. Perkins, C. Tischhauser, D. A. Swanson, R. S. Benson, T. B. Andersen, P. V. Mammini, "Diffraction testbed and results," SPIE conference Interferometry in Space, vol. 4852, 2002.
7. R. P. Korechoff, "MAM beam walk sensitivities," JPL Interoffice Memo, Dec. 10, 2001.
8. T. J. Shen, M. H. Milman, G. W. Neat, J. Catanzarite, "Dependence of the micro-arcsecond metrology (MAM) testbed performance prediction on white light algorithm approach", SPIE conference Interferometry in Space, vol. 4852, 2002.
9. A. C. Kuhnert, S. Shaklan, Y. Gursel, S. L. Azevedo, and Y. Lin, "Metrology for the Micro-Arcsecond Metrology Testbed", Proc. SPIE, 3350, p. 100.