Commercially fabricated radiation hardened 4Mbit SRAM

IEEE Aerospace Conference Proceedings

Volumn 4, Issue , 2004, Pages 2277-2282

  Hafer, Craig ^a   Slocum, Duane ^a   Mabra, Jonathan ^a   Tyson, Scott ^b  

^a Gaisler Research   (United Kingdom)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL-OFF-THE-SHELF (COTS); DATA BITS; SINGLE EVENT LATCHUP (SEL); TOTAL IONIZING DOSE (TID);

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COSTS; DECODING; ELECTRIC POTENTIAL; ELECTRIC POWER UTILIZATION; ENERGY TRANSFER; ERROR ANALYSIS; RADIATION HARDENING; XENON;

STATIC RANDOM ACCESS STORAGE;

EID: 11244333297     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2004.1368021     Document Type: Conference Paper

References (10)

1. Aeroflex UT8R128K32 128K×32 SRAM Preliminary Data Sheet (May 29, 2003)
2. Aeroflex UT8R512K8 512K×8 SRAM Preliminary Data Sheet (April 11, 2003)
3. Honeywell HX6408 512K×8 Static RAM - SOI Advance Information
4. J.M. Benedetto, D.B. Kerwin, and J. Chaffee, "Radiation Hardening of Commercial CMOS Processes Through Minimally Invasive Techniques", IEEE Radiation Effects Data Workshop, in Snowmass, Colorado, July 21, 1997, pp.105-109.
5. D.B. Kerwin and J.M. Benedetto, "Radiation Hardening of Submicron CMOS Wafers from Commercial Foundries", GOMAC Digest of Papers, in Arlington, Virginia, March 16, 1998, pp. 109-112.
6. D.B.Kerwin and J.M. Benedetto, "Total Dose and Single Event Effects Testing of UTMC Commercial RadHard™ Gate Arrays", IEEE Radiation Effects Data Workshop, in Newport Beach, California, July 24, 1998, pp. 80-85.
7. J.M. Benedetto and D.B. Kerwin, "Total Dose Hardening of a Deep Sub-Micron Process for Mixed-Signal Applications", GOMAC Digest of Papers. 2001, pp. 539-542.
8. J.M. Benedetto, "Single Event Effects and Prompt Dose Hardness of a Deep Sub-Micron Commercial Process", IEEE Radiation Effects Data Workshop, in Phoenix, Arizona, July 15, 2002, pp. 58-61.
9. "10MeV/nucleon cocktail (B to Xe)," http://www-nsd .lbl.gov/LBL-Programs/nsd/user88/10cocktail.htm
10. L.W. Massengill, M.L. Alles, S.E. Jones, and K.L. Jones, "Effects of Process Parameter Distributions and Ion Strike Locations on SEU Cross-section Data," IEEE Trans. Nucl. Sci. 40(6). pp. 1804-1811 (1993).