Ag induced modifications on WO3 films studied by AFM, Raman and x-ray photoelectron spectroscopy

Journal of Physics D: Applied Physics

Volumn 37, Issue 24, 2004, Pages 3383-3391

  Bittencourt, C ^a   Llobet, E ^b   Ivanov, P ^b   Vilanova, X ^b   Correig, X ^b   Silva, M A P ^c   Nunes, L A O ^c   Pireaux, J J ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

^b UNIVERSITAT ROVIRA I VIRGILI   (Spain)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; GRAIN SIZE AND SHAPE; NITROGEN OXIDES; RAMAN SPECTROSCOPY; SCREEN PRINTING; SILVER; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CATALYTIC REACTIONS; SELECTIVITY; SENSITIVITY; VIBRATION SPECTRA;

TUNGSTEN COMPOUNDS;

EID: 11144337829     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/24/005     Document Type: Article

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