Orientation control of high-density polyethylene molecular chains using atomic force microscope

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 43, Issue 11 A, 2004, Pages

  Kimura, Kuniko ^a   Kobayashi, Kei ^a   Yamada, Hirofumi ^a   Horiuchi, Toshihisa ^a   Ishida, Kenji ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Atomic force microscope; Edge on crystal; Lamellar crystal; Manipulation; Molecular orientation; Polyethylene; Surface modification

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; CRYSTALS; DEFORMATION; DIFFERENTIAL SCANNING CALORIMETRY; QUENCHING; SENSORS; SURFACE TREATMENT;

EDGE-ON CRYSTALS; LAMELLAR CRYSTALS; MANIPULATION; MELTING POINT;

HIGH DENSITY POLYETHYLENES;

EID: 11144289710     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.L1390     Document Type: Article

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