On the formation of oriented nanometer scale patterns on amorphous polymer surfaces studied by atomic force microscopy

Applied Surface Science

Volumn 148, Issue 3, 1999, Pages 147-154

  Pickering, J P ^a   Vancso, G J ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; LOADS (FORCES); PLASTIC DEFORMATION; POLYMERS; POLYSTYRENES; SCANNING TUNNELING MICROSCOPY; STRESSES; SURFACE TREATMENT;

AMORPHOUS POLYMER SURFACES; NANOSCALE MODIFICATION; ORIENTED NANOMETER SCALE PATTERNS; SCANNING PROBE MICROSCOPY; SURFACE DEFORMATION;

SURFACES;

EID: 0032627895     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00220-2     Document Type: Article

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