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Volumn 11, Issue 11, 2004, Pages 5328-5334
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The application of convolution-based statistical model on the electrical breakdown time delay distributions in neon
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Author keywords
[No Author keywords available]
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Indexed keywords
DELAY CIRCUITS;
ELECTRICAL ENGINEERING;
IONIZATION;
NEON;
NUMERICAL ANALYSIS;
PARAMETER ESTIMATION;
ELECTRICAL BREAKDOWN;
EXPONENTIAL DISTRIBUTION;
GAUSSIAN DISTRIBUTION;
STOCHASTIC MODELLING;
STATISTICAL METHODS;
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EID: 11144277928
PISSN: 1070664X
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1806478 Document Type: Article |
Times cited : (25)
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References (27)
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