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Volumn 11, Issue 11, 2004, Pages 5328-5334

The application of convolution-based statistical model on the electrical breakdown time delay distributions in neon

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CIRCUITS; ELECTRICAL ENGINEERING; IONIZATION; NEON; NUMERICAL ANALYSIS; PARAMETER ESTIMATION;

EID: 11144277928     PISSN: 1070664X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1806478     Document Type: Article
Times cited : (25)

References (27)
  • 24
    • 0003657593 scopus 로고
    • Seminumerical algorithms, 2nd ed.
    • Addison-Wesley, Reading
    • D. E. Knuth, Seminumerical Algorithms, 2nd ed., The Art of Computer Programming Vol. 2 (Addison-Wesley, Reading, 1981).
    • (1981) The Art of Computer Programming , vol.2
    • Knuth, D.E.1
  • 25
    • 0004325829 scopus 로고    scopus 로고
    • Numerical recipes in Fortran 77: The art of scientific computing, 2nd ed.
    • Cambridge University Press, Cambridge
    • W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannerly, Numerical Recipes in Fortran 77: The Art of Scientific Computing, 2nd ed., Fortran Numerical Recipes Vol. 1 (Cambridge University Press, Cambridge, 1997).
    • (1997) Fortran Numerical Recipes , vol.1
    • Press, W.H.1    Teukolsky, S.A.2    Vetterling, W.T.3    Flannerly, B.P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.