On the complex structure of the breakdown time-delay distribution in a neon-filled diode at 4 mbar pressure

Journal of Physics D: Applied Physics

Volumn 31, Issue 10, 1998, Pages 1206-1211

  Radovic M K ^a   Stepanovic O M ^a   Maluckov, C A ^a  

^a UNIVERSITY OF NI   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; NEON; VOLTAGE DISTRIBUTION MEASUREMENT;

NEON FILLED DIODE; STATISTICAL TIME DELAY;

SEMICONDUCTOR DIODES;

EID: 0032069674     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/31/10/012     Document Type: Article

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