Noise analysis of an Si-drift detector system with time-variant shaping

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 III, 2004, Pages 3845-3852

  Hansen, Karsten ^a   Reckleben, Christian ^a  

^a DESY   (Germany)

Author keywords

Noise index; Silicon drift detector (sdd); Spectral resolution; Spectroscopy; Time variant shaping; Weighting function, x ray

Indexed keywords

ABSORPTION SPECTROSCOPY; BANDWIDTH; CAPACITANCE; ELECTRIC POTENTIAL; SPURIOUS SIGNAL NOISE; WHITE NOISE; X RAY SPECTROSCOPY;

NOISE INDEX; SILICON DRIFT DETECTORS (SDD); TIME-VARIANT SHAPING;

PARTICLE DETECTORS;

EID: 11044231600     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839369     Document Type: Article

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