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Volumn 51, Issue 3 IV, 2004, Pages 1283-1288
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Spectral peak shift of Si-drift detectors with integrated JFETs
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Author keywords
Continuous reset; Peak shift; Readout chip; Silicon drift detector (SDD); X ray spectroscopy
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
FLUORESCENCE;
JUNCTION GATE FIELD EFFECT TRANSISTORS;
SEMICONDUCTING SILICON;
TIME DOMAIN ANALYSIS;
TRANSIENTS;
X RAY SPECTROSCOPY;
CONTINUOUS RESET;
PEAK SHIFTS;
READOUT CHIPS;
SILICON DRIFT DETECTORS (SDD);
DRIFT CHAMBERS;
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EID: 3342923584
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/TNS.2004.829374 Document Type: Article |
Times cited : (8)
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References (7)
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