JFET transistors for low-noise applications at low frequency

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 I, 2004, Pages 2975-2982

  Arnaboldi, Claudio ^a   Boella, Giuliano ^a   Panzeri, Emanuele ^a   Pessina, Gianluigi ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BOLOMETERS; CAPACITANCE; CRYOGENICS; ENERGY DISSIPATION; FREQUENCIES; LOGIC DESIGN; SPURIOUS SIGNAL NOISE;

CONNECTING WIRES; HEAT INJECTION; MICROBOLOMETERS; SAMPLE HOLDERS;

FIELD EFFECT TRANSISTORS;

EID: 11044222228     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839063     Document Type: Conference Paper

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