A cryogenic set-up for low-frequency noise characterization of electronic devices

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 520, Issue 1-3, 2004, Pages 644-646

  Arnaboldi, C ^a   Boella, G ^a   Mazza, R ^a   Panzeri, E ^a   Pessina, G ^a  

^a INFN SEZIONE DI MILANO   (Italy)

Author keywords

Cold Electronics; Cryogenic measurements; Low noise

Indexed keywords

APPROXIMATION THEORY; DIFFUSION; ELECTRONIC EQUIPMENT; HELIUM; SPECIFIC HEAT; STAINLESS STEEL; TELESCOPES; TRANSISTORS;

COLD ELECTRONICS; CRYOGENIC MEASUREMENTS; LOW NOISE;

SUPERCONDUCTING DEVICES;

EID: 1642587671     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.366     Document Type: Conference Paper

References (2)

1. Arnaboldi C., Fascilla A., Lund M.W., Pessina G. Nucl. Instr. and Meth. A. 517:2004;313.
2. Kandiah K., Whiting F.B. Solid-State Electron. 21:1978;1079.