The use of condition maps in the design and testing of power electronic circuits and devices

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 4, Issue , 2004, Pages 2520-2527

  Bryant, A T ^a   Parker Allotey, N A ^a   Palmer, P R ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Conditions; Device testing; Load cycles; Optimization; Power semiconductor devices

Indexed keywords

ELECTRIC INVERTERS; ELECTRONIC EQUIPMENT; OPTIMIZATION; ROTORS; SPEED CONTROL; SWITCHING; TORQUE;

CONDITIONS; DEVICE TESTING; LOAD CYCLES; POWER SEMICONDUCTOR DEVICES;

NETWORKS (CIRCUITS);

EID: 10944274170     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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