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Volumn 3, Issue , 2004, Pages 1924-1931

Characterization, parameter identification and modeling of a new monolithic emitter-switching bipolar transistor

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; IDENTIFICATION (CONTROL SYSTEMS); MATHEMATICAL MODELS; MOSFET DEVICES; SEMICONDUCTOR JUNCTIONS; SIMULATORS;

EID: 10944254997     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (13)
  • 3
    • 0028317906 scopus 로고
    • Insulated gate bipolar transistor (IGET) modeling using IG-spice
    • January/February
    • Chang Su Mitter, Allen R. Hefner, Dan Y. Chen, Fred C. Lee, "Insulated Gate Bipolar Transistor (IGET) Modeling Using IG-Spice," IEEE Transaction on Industry Applications, Vol. 30, No. 1, January/February 1993, pp. 24-33.
    • (1993) IEEE Transaction on Industry Applications , vol.30 , Issue.1 , pp. 24-33
    • Mitter, C.S.1    Hefner, A.R.2    Chen, D.Y.3    Lee, F.C.4
  • 4
    • 0032124057 scopus 로고    scopus 로고
    • Modeling and characterization of an 80 V silicon LDMOSFET for emerging RFIC applications
    • July
    • Prasanth Perugupalli, Malay Trivedi, Krishna Shenai, S. K. Leong, "Modeling and Characterization of an 80 V Silicon LDMOSFET for Emerging RFIC Applications," IEEE Transactions on Electron Devices, Vol. 45, No. 7, July 1998, pp. 575-585.
    • (1998) IEEE Transactions on Electron Devices , vol.45 , Issue.7 , pp. 575-585
    • Perugupalli, P.1    Trivedi, M.2    Shenai, K.3    Leong, S.K.4
  • 6
    • 0034313571 scopus 로고    scopus 로고
    • Charge-control modeling of power bipolar junction transistors
    • November
    • Ramachadran Vijayalakshmi, Malay Trivedi, Krishna Shenai, "Charge-Control Modeling of Power Bipolar Junction Transistors," IEEE Transactions on Power Electronics, Vol. 15, No. 6, November 2000, pp. 1072-1080.
    • (2000) IEEE Transactions on Power Electronics , vol.15 , Issue.6 , pp. 1072-1080
    • Vijayalakshmi, R.1    Trivedi, M.2    Shenai, K.3
  • 7
    • 0026107897 scopus 로고
    • Measurement of collector and emitter resistances in bipolar transistors
    • February
    • Ju-Sung Park, Arnost Nugroschel, Victor de la Torre, Peter J. Zdebel, "Measurement of Collector and Emitter Resistances in Bipolar Transistors," IEEE Transaction on Electron Devices, Vol. 38, No. 2, February 1991, pp. 365-372.
    • (1991) IEEE Transaction on Electron Devices , vol.38 , Issue.2 , pp. 365-372
    • Park, J.-S.1    Nugroschel, A.2    De La Torre, V.3    Zdebel, P.J.4
  • 8
    • 0026241960 scopus 로고
    • Simple determination of BJT extrinsic base resistance
    • 10 October
    • T. Zimmer, A. Meresse, Ph. Cazenave, J. P. Dom, "Simple Determination of BJT Extrinsic Base Resistance," Electronics Letters, Vol. 27, No. 21, 10 October 1991, pp. 1895-1896.
    • (1991) Electronics Letters , vol.27 , Issue.21 , pp. 1895-1896
    • Zimmer, T.1    Meresse, A.2    Cazenave, Ph.3    Dom, J.P.4
  • 9
    • 0022083515 scopus 로고
    • A unified circuit model for bipolar transistors including quasi-saturation effects
    • June
    • George M. Kull, Laurence W. Nagel, Shiuh-Wuu Lee, Peter Lloyd, E. James Prendergast, Heinz Dirks, "A Unified Circuit Model for Bipolar Transistors Including Quasi-Saturation Effects," IEEE Transaction on Electron Devices, Vol. ED-32, No. 6, June 1985, pp. 1103-1113.
    • (1985) IEEE Transaction on Electron Devices , vol.ED-32 , Issue.6 , pp. 1103-1113
    • Kull, G.M.1    Nagel, L.W.2    Lee, S.-W.3    Lloyd, P.4    Prendergast, E.J.5    Dirks, H.6
  • 12
  • 13
    • 0005767520 scopus 로고
    • Open circuit voltage decay behavior of junction devices
    • Pergamon Press
    • S. C. Choo and R. G. Mazur, "Open Circuit Voltage Decay Behavior of Junction Devices," Solid-State Electronics, Pergamon Press 1970. Vol. 13, pp. 553-564.
    • (1970) Solid-state Electronics , vol.13 , pp. 553-564
    • Choo, S.C.1    Mazur, R.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.